| Title:
|
Inflated truncated negative binomial acceptance sampling plan (English) |
| Author:
|
Rychlik, Zdzisław |
| Author:
|
Szynal, Dominik |
| Language:
|
English |
| Journal:
|
Aplikace matematiky |
| ISSN:
|
0373-6725 |
| Volume:
|
22 |
| Issue:
|
3 |
| Year:
|
1977 |
| Pages:
|
157-165 |
| Summary lang:
|
English |
| Summary lang:
|
Czech |
| Summary lang:
|
Russian |
| . |
| Category:
|
math |
| . |
| Summary:
|
This paper gives the maximum likelihood estimations of the process (or lot) average proportion $p$ of defectives and the proportion $(\alpha)$ of the population which follows a negative binomial distribution based on attribute samples that have been curtailed either with the rejection of a lot on finding the $k$th defective or with the acceptance of it on finding the $K$th nondefective. These estimates are based on inspection from a sequence of $m$ lots of inspected items. Moreover, the linear estimates of $p$ and $\alpha$ and the asymptotic variance and covariance of considered estimators are given. () |
| MSC:
|
62D05 |
| MSC:
|
62N10 |
| idZBL:
|
Zbl 0369.62013 |
| idMR:
|
MR0445762 |
| DOI:
|
10.21136/AM.1977.103688 |
| . |
| Date available:
|
2008-05-20T18:06:57Z |
| Last updated:
|
2020-07-28 |
| Stable URL:
|
http://hdl.handle.net/10338.dmlcz/103688 |
| . |
| Reference:
|
[1] С. A. Cohen: Curtailed attribute sampling.Technometrics 12 (1970), 295-298. Zbl 0213.20602, 10.1080/00401706.1970.10488668 |
| Reference:
|
[2] H. Cramér: Mathematical methods of statistics.Princeton Univ. Press, Princeton 1946. MR 0016588 |
| Reference:
|
[3] C. C. Craig: The ASN for truncated single and double attribute acceptance sampling plans.ASQC Convention Transactions (1968), 63 - 67. |
| Reference:
|
[4] C. C. Craig: The average sample number for truncated single and double attribute sampling plans.Technometrics 10 (1968), 685-692. MR 0235669, 10.2307/1267452 |
| Reference:
|
[5] K. N. Pandey: On generalized inflated Poisson distribution.J. Scient. Res. Banaras Hindu Univ. 15 (1964-1965), 157-162. MR 0202168 |
| Reference:
|
[6] G. P. Patil: On the evaluation of the negative binomial distribution with example.Technometrics 2 (1960), 501-505. MR 0119280, 10.1080/00401706.1960.10489915 |
| Reference:
|
[7] G. P. Patil: Note on the equivalence of the binomial and inverse binomial acceptance sampling plans and an acknowledgement.Technometrics 5 (1963), 119-121. 10.1080/00401706.1963.10490062 |
| Reference:
|
[8] A. G. Phatak M. M. Bhatt: Estimation of fraction defective in curtailed sampling plans.Technometrics 9 (1967), 219-228. MR 0216708, 10.1080/00401706.1967.10490457 |
| Reference:
|
[9] M. P. Singh: Inflated binomial distribution.J. Scient. Res. Banaras Hindu Univ. 16 (1965 to 1966), 87-90. |
| Reference:
|
[10] S. N. Singh: Probability models for the variation in the number of births per couple.J. Am. Statist. Ass. 58 (1972), 721-727. MR 0152092 |
| . |
