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cluster point process; Voronoi tessellation; induced tessellation; coefficients of variation of cell size characteristics
A new point process is proposed which can be viewed either as a Boolean cluster model with two cluster modes or as a $p$-thinned Neyman-Scott cluster process with the retention of the original parent point. Voronoi tessellation generated by such a point process has extremely high coefficients of variation of cell volumes as well as of profile areas and lengths in the planar and line induced tessellations. An approximate numerical model of tessellation characteristics is developed for the case of small cluster size; its predictions are compared with the results of computer simulations. Tessellations of this type can be used as models of grain structures in steels.
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