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Title: Single-use reliability computation of a semi-Markovian system (English)
Author: D'Amico, Guglielmo
Language: English
Journal: Applications of Mathematics
ISSN: 0862-7940 (print)
ISSN: 1572-9109 (online)
Volume: 59
Issue: 5
Year: 2014
Pages: 571-588
Summary lang: English
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Category: math
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Summary: Markov chain usage models were successfully used to model systems and software. The most prominent approaches are the so-called failure state models Whittaker and Thomason (1994) and the arc-based Bayesian models Sayre and Poore (2000). In this paper we propose arc-based semi-Markov usage models to test systems. We extend previous studies that rely on the Markov chain assumption to the more general semi-Markovian setting. Among the obtained results we give a closed form representation of the first and second moments of the single-use reliability. The model and the validity of the results are illustrated through a numerical example. (English)
Keyword: system reliability
Keyword: semi-Markov chain
Keyword: usage model
MSC: 60K15
MSC: 65C40
MSC: 65R20
MSC: 90B25
idZBL: Zbl 06391451
idMR: MR3255796
DOI: 10.1007/s10492-014-0072-4
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Date available: 2014-09-29T09:02:58Z
Last updated: 2020-07-02
Stable URL: http://hdl.handle.net/10338.dmlcz/143931
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Reference: [11] Prowell, S. J., Poore, J. H.: Computing system reliability using Markov chain usage models.J. Systems Software 73 (2004), 219-225. 10.1016/S0164-1212(03)00241-3
Reference: [12] Sayre, K. D.: Improved Techniques for Software Testing Based on Markov Chain Usage Models.PhD Thesis, The University of Tennessee, Knoxville, Tennessee (1999).
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